A Novel RTL ATPG Model Based on Gate Inherent Faults (GIF-PO
A Novel RTL ATPG Model Based on Gate Inherent Faults (GIF-PO
The effect due to power is prominent in lower technology nodes We need to incorporate low power ATPG techniques like X-fill, clock gating control, blocking
▫ Automatic Test Pattern Generator 19 Page 20 ATPG Architecture 20 Circuit description Reduced Fault List Test Pattern Fault Simulator Fault
atpg ATPG setup · legacy flow 需要test procedure 文件以及setup文件即dofile(包含扫描链插入工具导出的setup信息,插入到设计中的test structure信息以及时钟
atpg Designs using ATPG scan patterns require multiple sets of patterns to target known fault models like stuck-at, transition, path delay, small
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